X-ray Fluorescence (XRF) Spectroscopy

The handheld XRF can be used for in situ non-destructive elemental analysis. It is complementary to Raman spectroscopy and reflectance spectroscopy obtained from spectral imaging or FORS.

Portable XRF spectrometer in action

Applications:

  • Assistance in identification inorganic pigments

  • Examination of the elemental composition of glass.

Contact

ISAAC Lab

ISTeC 003

School of Science and Technology
Nottingham Trent University
Clifton Campus,

Nottingham
NG11 8NS

Tel: +44 115 84 86360

E-mail: ​ isaac@ntu.ac.uk

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