X-ray Fluorescence (XRF) Spectroscopy
The handheld XRF can be used for in situ non-destructive elemental analysis. It is complementary to Raman spectroscopy and reflectance spectroscopy obtained from spectral imaging or FORS.
Assistance in identification inorganic pigments
Examination of the elemental composition of glass.
Portable XRF spectrometer in action
X-ray Fluorescence (XRF) Scanning
Our lab is equipped with a Bruker CRONO XRF system, offering the ability for in-situ XRF scanning of cultural heritage objects. The optimal focus distance of 5 – 7 mm from the sample allows for non-contact measurements. The system has a motorised XYZ frame (scanning range 600 mm x 450 mm x 75 mm) that automatically scans and produces an XRF spectral image cube with a spatial resolution of 0.5,1 or 2 mm and scanning speed up to 42 mm/s.