X-ray Fluorescence (XRF) Spectroscopy

The handheld XRF can be used for in situ non-destructive elemental analysis. It is complementary to Raman spectroscopy and reflectance spectroscopy obtained from spectral imaging or FORS.

Applications:

  • Assistance in identification inorganic pigments

  • Examination of the elemental composition of glass.

Portable XRF spectrometer in action

X-ray Fluorescence (XRF) Scanning

Our lab is equipped with a Bruker CRONO XRF system, offering the ability for in-situ XRF scanning of cultural heritage objects. The optimal focus distance of 5 – 7 mm from the sample allows for non-contact measurements. The system has a motorised XYZ frame (scanning range 600 mm x 450 mm x 75 mm) that automatically scans and produces an XRF spectral image cube with a spatial resolution of 0.5,1 or 2 mm and scanning speed up to 42 mm/s.

XRF_Systems.jpg

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